Spectroscopic mapping products and services

Science ۰ Engineering ۰ Failure analysis ۰ Forensics ۰ Process control

Top left: Threading dislocations in solid state materials using photoluminescence. Top right: Elemental composition in crystal growth, also using photoluminescence. Bottom left: Raman signatures from polymer blends. Bottom right: Surface profiling of an etched Si wafer. Details may be found on the application pages.